Characterisation

Seeing the invisible. Electron and probe microscopy, XRD and Scherrer analysis, DLS, spectroscopy and surface analysis.

• Nanoscale Characterisation Techniques — Seeing and measuring the invisible. Learn electron microscopy (SEM, TEM, HRTEM, STEM, EDS), scanning probe microscopy (AFM, STM), X-ray diffraction with Bragg's law and Scherrer crystallite size, dynamic light scattering and zeta potential, UV-Vis and photoluminescence spectroscopy, Raman (graphene layers), XPS surface chemistry, BET surface area, and choosing the right technique — with Python for d-spacing, Scherrer size, DLS hydrodynamic diameter and the electron wavelength that sets TEM resolution.